M. C. Seraphim
Institute of Optics, Information and Photonics University of Erlangen-Nuremberg
4 papers
A18 · Talk · 111. Conference (2010)
Algorithmic Elimination of Parasitic Reflections in Deflectometry
A19 · Talk · 111. Conference (2010)
UV-Deflectometry: No parasitic reflections
A22 · Talk · 111. Conference (2010)
Tuning Structured Illumination Microscopy (SIM) for the Inspection of Micro Optical Components
P9 · Poster · 111. Conference (2010)