S. van Haver

Delft University of Technology, TNW-IST, Optics Research Group, Lorentzweg 1, 2628 CJ Delft, The Netherlands

1 paper

B34 · Talk · 113. Conference (2012)

Experimental Validation of the Extended-Nijboer-Zernike (ENZ) based Aberration Retrieval Method for Microscope Objectives

A. Wiegmann, S. van Haver, N. Kumar, S.F. Pereira