S. F. Pereira

Delft University of Technology, The Netherlands.

4 papers

B2 · Talk · 114. Conference (2013)

Sensitivity analysis of phase retrieval from a single defocused intensity measurement

A. Polo, S.F. Pereira, H. P. Urbach

P13 · Poster · 114. Conference (2013)

Coherent Fourier Scatterometry combined with Interferometry

S. Roy, N. Kumar, S. F. Pereira, H. P. Urbach

B34 · Talk · 113. Conference (2012)

Experimental Validation of the Extended-Nijboer-Zernike (ENZ) based Aberration Retrieval Method for Microscope Objectives

A. Wiegmann, S. van Haver, N. Kumar, S.F. Pereira

P49 · Poster · 113. Conference (2012)

Aberration retrieval from a single-out-of focus intensity measurement

A. Polo, S. F. Pereira, H. P. Urbach