T. Klein

BIAS-Bremer Institut für angewandte Strahltechnik GmbH, Klagenfurter Str. 2, 28359 Bremen, Germany

2 papers

A29 · Talk · 119. Conference (2018)

Improved reconstruction quality of holographic projections by controlling the individual pixel shape

F. Thiemicke, T. Klein, R. B. Bergmann , C. Falldorf

P43 · Poster · 113. Conference (2012)

Traceable measurement of nanoparticle size using transmission scanning electron microscopy (TSEM)

E. Buhr, T. Klein, D. Bergmann, C.G. Frase