F. Schiffers

Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, IL 60208, USA

6 Beiträge

B13 · Vortrag · 120. Tagung (2019)

Uncalibrated Deflectometry on a Mobile Device for the 3D Measurement of Stained Glass Artwork

F. Willomitzer, W. Spies, C-K. Yeh, F. Schiffers, M. Walton, O. Cossairt

A13 · Vortrag · 116. Tagung (2015)

Towards the single-shot 3D movie camera

F. Willomitzer, F. Schiffers, M. Kuch, G. Häusler

A8 · Vortrag · 116. Tagung (2015)

Single-shot Phase Measuring Deflectometry for Cornea Measurements

H. Liang, E. Olesch, Z. Yang, F. Schiffers, G. Häusler

P10 · Poster · 115. Tagung (2014)

Automated evaluation tools in medicine enabled by a motion-robust optical 3D sensor

S. Ettl, F. Schiffers, F. Willomitzer, S. Rampp, C. Strauss, G. Häusler

P11 · Poster · 115. Tagung (2014)

Multi-line triangulation with many lines

M. Kuch, F. Schiffers, Z. Yang, F. Willomitzer, S. Ettl, G. Häusler

P12 · Poster · 115. Tagung (2014)

Calibration of multi-line-light-sectioning

F. Schiffers, F. Willomitzer, S. Ettl, Z. Yang, G. Häusler