M. Agour

BIAS-Bremer Institut für angewandte Strahltechnik GmbH, Klagenfurter Str. 2, 28359 Bremen, Germany

6 Beiträge

B20 · Vortrag · 122. Tagung (2021)

Γ-Profilometry on Rough Surfaces

C. Falldorf, M. Agour , R. B. Bergmann

P9 · Poster · 122. Tagung (2021)

Quasi-optical components for the THz-regime: Fabrication and characterization

M. Agour , C. Falldorf , F. Taleb, E. Castro-Camus, M. Koch, R.B. Bergmann

A29 · Vortrag · 121. Tagung (2020)

Fabrication of polymer-based microstructures on optical multimode fibers

F. Thiemicke, L. Pätzold, M. Agour , C. Falldorf, R. B. Bergmann

A8 · Vortrag · 121. Tagung (2020)

Form profiler based on imaging with spatially partially coherent light

M. Agour , C. Falldorf, R. B. Bergmann

B18 · Vortrag · 121. Tagung (2020)

Four-dimensional calibration of a Multiple Aperture Shear-Interferometer

A. F. Müller, C. Falldorf, M. Agour , M. Lotzgeselle, A. Straub, G. Ehret, R. B. Bergmann

A12 · Vortrag · 119. Tagung (2018)

Lens inspection using Multiple Aperture Shear Interferometry: Comparison to Wave Front Sensing Methods

C. Falldorf, A. Müller, M. Agour, J.-H. Hagemann, G. Ehret, R. B. Bergmann