D. Kraus

Leibniz Institute of Photonic Technology, Jena, Germany

1 Beitrag

B36 · Vortrag · 119. Tagung (2018)

Speckle imaging for surface measurement with low-cost laser diodes

R. Riesenberg, A. Wuttig, M. Kanka, D. Kraus, M. Zieger, M. Kaatz