C. Husemann

Carl Zeiss AG, Jena

3 papers

B19 · Talk · 123. Conference (2022)

Improving optical metrology by subpixel reference imaging simulations

D. Seidel, J. Umlauft, C. Lutzweiler, C. Husemann

H6 · Keynote · 122. Conference (2021)

Computational Imaging Applications: Techniques, Challenges and Prospects

H4 · Keynote · 121. Conference (2020)

Computational Imaging Applications: Techniques, Challenges, and Prospects