Micro-testing by ultra-sensitive imaging
- Leibniz-Institut für Photonische Technologien e.V., Leibniz Institute of Photonic Technology
rainer [dot] riesenberg [at] ipht-jena [dot] de
An unconventional imaging technique based on synthetic apertures was presented on the 107. Jahrestagung of the DGaO (Poceedings, A25). For lensless holographic microscopy commonly the coherent illumination of a sample by a pinhole is used. We replaced the pinhole by a pinhole-array. - The photon flux is increased by the number of pinholes (up to 16 pinholes are used). - The interference pattern generated by a multi pinhole source is very intensive. - It becomes possible to use larger pinholes with increased throughput (typical are diameters of 2 µm). Simultaneously the numerical detection aperture can be increased by coherent multi-spot source. The array-illumination enables an increase of the detection sensitivity with a CCD by a factor of more than 100 … 1000. The technique is applied on imaging of calibration standards in sub-µm and µm ranges. Bright field and phase contrast images can be derived from the measured intensity pattern simultaneously.
@inproceedings{riesenberg2007a34,
author = {Riesenberg, Rainer and Kanka, Mario},
title = {{Micro-testing by ultra-sensitive imaging}},
booktitle = {DGaO-Proceedings 2007},
series = {DGaO-Proceedings},
eventtitle = {108. Jahrestagung der DGaO},
eventdate = {2007-05-30/2007-06-02},
venue = {Heringsdorf},
publisher = {Deutsche Gesellschaft für angewandte Optik e.V.},
year = {2007},
pages = {A34},
langid = {english},
url = {https://dgao-proceedings.de/paper/108-a34}
}