Industrial Microscopy: From Polarisation Optics up to latest profiling Technology

At the DGaO-conference 2010, application areas and state-of-the-art solutions of industrial microscopy will be discussed. From polarization optics for the detection and analysis e.g. of minerals, dedicated metal microscopes in an upright or inverted design up to latest profiling systems in Dual Core technology are subject of a detailed investigation. Advantage of the latest Dual Core techonolgy for industrial investigation is the possibility to have a system equipped with confocal scanning and Interferometry scanning in the same system. Thus it is possible to measure from rough to very smooth surfaces with resolutions of up to 1 Å within a few seconds only. The technology and related measuring examples will be demonstrated.