Correlation of the simulated light pattern on manufacturer-based LED rayfiles with goniophotometric measurements

The developing process of optical systems such as lamps on the LED basis requires three basic steps for each component: design, prototyping and validation. In the design phase, optical simulations of the system are performed based on rayfiles provided by light source manufacturers. Ideally, these simulations lead to a set of parameters and requirements which can later on be easily validated. When using rayfiles for lamp simulation, the results in the validation phase are likely to differ since the emission characteristics of light sources vary due to production tolerances. For this reason, the measurement of the light source used for validation of the design and its implementation in the design phase is necessary. In this paper several different power-LEDs are measured in a reference reflector and variance of the measurements is determined. The results are compared with the simulation based on the manufacturer’s rayfiles. The development of the reference reflector as well as generation of data of light pattern for each power-LED will be performed using light simulation software. The measurements are taken using a goniophotometer for the validation of the generated light pattern.