Speckle pattern based deflectometry

Deflectometric measurements of reflecting surfaces are becoming increasingly important in industrial metrology. For production and the following quality control surfaces need to be measured very accurately. Hereby touchless surface scans without additional coating of scattering layers is often preconditioned. Classical deflectometry often uses fringe projection techniques, where coding is obtained via phase shifting. However this kind of illumination places high demands on the used projector or screen. We propose a deflectometric system based on laser speckle projection. Hereby we use the well known principles of a photogrammetric measurement system as basis. Resulting from the recorded images the three dimensional object point can be obtained via triangulation. The goal of this project is to develop and improve a real time, laser speckle based, deflectometric measurement system.