Limits of Brewster Imaging

We explore the limits of Brewster imaging that may open up other possible applications of the technique. Brewster imaging is one of the most widely used imaging tool in the study of monolayer of supramolecular systems at water-air interface. Here, we study some factors that may inhibit the use of this technique for other surfaces such as in thin dielectric and metallic oxide films on dielectric substrate. We show that the Brewster imaging have a definite working region to have a unique thickness value as expected, but we notice that the substrate’s index of refraction has little effect on this range. We also determine the theoretical minimum thickness that can be detected based on the signal-to-noise ratio.