Dynamic High-Precision ToF Imaging utilizing Single-Shot Synthetic Wavelength Interferometry on Rough Surfaces

Motion-robust high-precision 3D measurements are of great interest in many modern imaging applications, including medical imaging, quality inspection, or accurate scene capturing in VR/AR. Although the utilization of commercial time-of-flight (ToF) cameras yields several benefits for this kind of applications (such as robustness to occlusions), the depth precision of most devices leaves much room for improvement, preventing ToF cameras from being widely used if high-quality 3D images are desired. In this contribution, we introduce a family of novel “ToF cameras” targeted for the precise 3D measurement of dynamic objects. Our method is based on Synthetic Wavelength Interferometry on rough surfaces. Previous iterations of our systems required multiple sequentially captured images and hence were limited to static objects. We will now present a significant advancement of our technique that allows for 3D reconstruction in single-shot with up to 350μm depth precision, using only off-the-shelf CMOS cameras. Moreover, we will discuss the application of our single-shot principle to dynamic non-line-of-sight (NLoS) imaging – the ability to look around corners and through scattering media.