C. Koos

Institute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), Germany Institute of Photonics and Quantum Electronics (IPQ), Karlsruhe Institute of Technology (KIT), Germany Vanguard Automation GmbH, Karlsruhe, Germany

8 Beiträge

H7 · Hauptvortrag · 121. Tagung (2020)

3D Nano-Printing in Integrated Optics: From Laboratory Experiments to Industrial Production

A4 · Vortrag · 116. Tagung (2015)

High-precision laser ranging for industrial metrology with dual-color electro-optic frequency combs

C. Weimann , F. Hoeller, W. Freude , C. Koos

A1 · Vortrag · 115. Tagung (2014)

Fast high-precision distance measurements with electro-optic frequency combs

C. Weimann, , S. Wolf, D. Meier, Y. Schleitzer, M. Totzeck, A. Heinrich, F. Hoeller, W. Freude, , C. Koos,

A16 · Vortrag · 115. Tagung (2014)

Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles

S. Schneider, A. Krämer, F. Eppler, H. Alemye, C. Hübner, I. Mikonsaari, W. Freude,, C. Koos,

A2 · Vortrag · 115. Tagung (2014)

Kerr-Frequenzkämme und deren Stabilisierung für die Terabit-Kommunikation

J. Pfeifle, V. Brasch, P. C. Schindler, C. Weimann, Y. Yu, W. Freude,, T. J. Kippenberg, C. Koos,

B15 · Vortrag · 115. Tagung (2014)

Lasing goblet resonators – active microstructures for integrated biosensors

S. Koeber ,, U.Bog, T. Wienhold, S. F. Wondimu, T. Mappes, F.Brinkmann, M. Hirtz, S. Wiegele, H. Kalt, C. Koos,

H1 · Hauptvortrag · 115. Tagung (2014)

Silicon Photonics, Hybrid Integration, and Frequency Combs: Technologies for Terabit/s Communications, Teratronics, and Optical Metrology

C. Koos , W. Freude, R. Palmer, M. Lauermann, S. Koeber, J. Pfeifle,C. Weimann P. C. Schindler, N. Lindenmann, T. Hoose, M. R. Billah,

P24 · Poster · 115. Tagung (2014)

Frequenzmultiplex-Verfahren für zukünftige optische Zugangsnetzwerke

P. C. Schindler, R. Schmogrow, M. Dreschmann, S. Wolf, J. Meyer, D. Hillerkuss, I. Tomkos, J. Prat, H.-G. Krimmel, T. Pfeiffer, P. Kourtessis, J. Becker, C. Koos, W. Freude, J. Leuthold,