DGaO·Proceedings ISSN 1614-8436
DE

C. Koos

Institute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), Germany Institute of Photonics and Quantum Electronics (IPQ), Karlsruhe Institute of Technology (KIT), Germany Vanguard Automation GmbH, Karlsruhe, Germany

8 papers

H7 · Keynote · 121. Conference (2020)

3D Nano-Printing in Integrated Optics: From Laboratory Experiments to Industrial Production

C. Koos
A4 · Talk · 116. Conference (2015)

High-precision laser ranging for industrial metrology with dual-color electro-optic frequency combs

C. Weimann , F. Hoeller, W. Freude , C. Koos
Talk PDF
A1 · Talk · 115. Conference (2014)

Fast high-precision distance measurements with electro-optic frequency combs

C. Weimann, , S. Wolf, D. Meier, Y. Schleitzer, M. Totzeck, A. Heinrich, F. Hoeller, W. Freude, , C. Koos,
Talk PDF
A16 · Talk · 115. Conference (2014)

Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles

S. Schneider, A. Krämer, F. Eppler, H. Alemye, C. Hübner, I. Mikonsaari, W. Freude,, C. Koos,
A2 · Talk · 115. Conference (2014)

Kerr-Frequenzkämme und deren Stabilisierung für die Terabit-Kommunikation

J. Pfeifle, V. Brasch, P. C. Schindler, C. Weimann, Y. Yu, W. Freude,, T. J. Kippenberg, C. Koos,
B15 · Talk · 115. Conference (2014)

Lasing goblet resonators – active microstructures for integrated biosensors

S. Koeber ,, U.Bog, T. Wienhold, S. F. Wondimu, T. Mappes, F.Brinkmann, M. Hirtz, S. Wiegele, H. Kalt, C. Koos,
H1 · Keynote · 115. Conference (2014)

Silicon Photonics, Hybrid Integration, and Frequency Combs: Technologies for Terabit/s Communications, Teratronics, and Optical Metrology

C. Koos , W. Freude, R. Palmer, M. Lauermann, S. Koeber, J. Pfeifle,C. Weimann P. C. Schindler, N. Lindenmann, T. Hoose, M. R. Billah,
P24 · Poster · 115. Conference (2014)

Frequenzmultiplex-Verfahren für zukünftige optische Zugangsnetzwerke

P. C. Schindler, R. Schmogrow, M. Dreschmann, S. Wolf, J. Meyer, D. Hillerkuss, I. Tomkos, J. Prat, H.-G. Krimmel, T. Pfeiffer, P. Kourtessis, J. Becker, C. Koos, W. Freude, J. Leuthold,