P26 · Poster · 121. Tagung (2020)
Analysis of ellipsometric layer thickness measurements applying a novel optimization method for depolarizing Mueller matrices
T. Grunewald, M. Wurm, S. Teichert, B. Bodermann, J. Reck, U. Richter
P10 · Poster · 120. Tagung (2019)
A new method to derive best-fit parameters and their uncertainties from depolarizing Mueller-matrices
T. Grunewald, M. Wurm, S. Teichert, B. Bodermann, J. Reck, U. Richter