U. Richter

SENTECH Instruments GmbH, Schwarzschildstraße 2, 12489 Berlin, Germany

2 papers

P26 · Poster · 121. Conference (2020)

Analysis of ellipsometric layer thickness measurements applying a novel optimization method for depolarizing Mueller matrices

T. Grunewald, M. Wurm, S. Teichert, B. Bodermann, J. Reck, U. Richter

P10 · Poster · 120. Conference (2019)

A new method to derive best-fit parameters and their uncertainties from depolarizing Mueller-matrices

T. Grunewald, M. Wurm, S. Teichert, B. Bodermann, J. Reck, U. Richter