M. Sandner
Bremer Institut für Angewandte Strahltechnik (BIAS), Klagenfurter Str. 2, 28359 Bremen, Germany
3 papers
B29 · Talk · 115. Conference (2014)
Reflection Characterization: 3D shape measurement of a surface using its diffuse and specular reflections
A1 · Talk · 114. Conference (2013)
Simulationsstudien für Deflektometriesysteme
A2 · Talk · 112. Conference (2011)