Christian Faber
Faculty of Electrical Engineering and Industrial Engineering, Landshut University of Applied Sciences
Hochschule Landshut, Landshut University of Applied Sciences
Sensor Technology and Image Processing, Landshut University of Applied Sciences
Institute of Optics, Information and Photonics, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
Chair of Optics, OSMIN Group, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
40 papers
A2 · Talk · 127. Conference (2026)
Deflectometric Measurement of Astronomical Mirrors: Comparison of Different Calibration and Evaluation Methods
S1 · Invited Talk · 127. Conference (2026)
PDF
Resolution Enhancement in Digital Holography through Adaptive Speckle Illumination
H4 · Keynote · 126. Conference (2025)
PDF
From differentiable modelling to system optimization: The full journey using Geometric Algebra exemplarily applied to improve light sectioning systems
B1 · Talk · 125. Conference (2024)
PDF
The anycentric camera: A unifying pinhole model for ento-, hyper- and telecentric lenses using Geometric Algebra
B8 · Talk · 124. Conference (2023)
PDF
Combining simulation and optimization: Multipurpose modelling of camera-based optical metrology systems
A21 · Talk · 123. Conference (2022)
PDF
Shedding new light on ray tracing for optical metrology systems by using Geometric Algebra
A24 · Talk · 122. Conference (2021)
Ein neuer Ansatz für den Phase-Unwrap bei der monokularen phasenmessenden Single-Shot Deflektometrie
A14 · Talk · 121. Conference (2020)
PDF
Ein neuer Ansatz für den Phase-Unwrap bei der monokularen phasenmessenden Single-Shot Deflektometrie
P7 · Poster · 121. Conference (2020)
Lokalisierte Single-Shot-Auswertung für die phasenmessende Deflektometrie mit Wavelet Transformation
A12 · Talk · 120. Conference (2019)
PDF
Inverse Streifenprojektion kombiniert mit Wavelet-Transformation als optische Inline-Inspektionslösung in der Umformtechnik
B14 · Talk · 120. Conference (2019)
PDF
Eine neue Methode zur Lösung des Höhenproblems in der Deflektometrie
B27 · Talk · 119. Conference (2018)
Frequenzcodierte Deflektometrie
P1 · Poster · 119. Conference (2018)
PDF
On-the-Fly-Deflektometrie zur schnellen 3D-Inline-Inspektion in der Bewegung
P2 · Poster · 119. Conference (2018)
PDF
Optimierte Erzeugung eines inversen Streifenmusters für die Inline-3D-Inspektion in der Umformtechnik
A21 · Talk · 118. Conference (2017)
PDF
Linienintegration eines Single-Shot-3D-Sensors in einer Saugerbalken-Presse
B11 · Talk · 118. Conference (2017)
PDF
Das Beste aus zwei Welten: Fusion von Phasenmessender Deflektometrie und Shape from Specular Flow
B15 · Talk · 118. Conference (2017)
Vergleich von modellfreier und modellbasierter Kalibrierung eines Lichtschnittsensors mit allgemeiner applikationsspezifischer Beleuchtungsoptik
B2 · Talk · 117. Conference (2016)
PDF
Inline detection of defects on free formed metal pressings using a single shot inverse fringe projection approach
B6 · Talk · 117. Conference (2016)
PDF
Easy field-applicable calibration of a miniaturized light sectioning sensor with application-specific illumination optics
A2 · Talk · 114. Conference (2013)
Accurate Deflectometry for non-cooperative Applications
A16 · Talk · 114. Conference (2013)
Tomographic Triangulation
A8 · Talk · 113. Conference (2012)
PDF
Why can't we purchase a perfect single shot 3D-sensor?
A25 · Talk · 113. Conference (2012)
Compact PMD measurement and PSF reconstruction for large mirrors
P28 · Poster · 113. Conference (2012)
PDF
Object reconstruction by deflectometry
P29 · Poster · 113. Conference (2012)
Kill two birds with one stone - measure shape and reflectivity at the same time
A1 · Talk · 112. Conference (2011)
Phase-Shift vs. Line-Shift: Two ways to do Deflectometry
A3 · Talk · 112. Conference (2011)
PDF
Deflektometrische Selbstkalibrierung für spiegelnde Objekte
A6 · Talk · 112. Conference (2011)
PDF
Full-field macroscopic measurement of specular, curved surfaces with SIM
P27 · Poster · 112. Conference (2011)
Deflectometric Measurement of 10,000 Telescope Mirror Tiles
P28 · Poster · 112. Conference (2011)
PDF
Deflectometry for Ultra Precision Machining - Measuring without Rechucking
P36 · Poster · 112. Conference (2011)
PDF
Driving Structured-Illumination Microscopy towards the Limits of Efficiency and Accuracy
A18 · Talk · 111. Conference (2010)
Algorithmic Elimination of Parasitic Reflections in Deflectometry
A19 · Talk · 111. Conference (2010)
PDF
UV-Deflectometry: No parasitic reflections
A22 · Talk · 111. Conference (2010)
PDF
Tuning Structured Illumination Microscopy (SIM) for the Inspection of Micro Optical Components
P9 · Poster · 111. Conference (2010)
Information efficient and accurate Structured Illumination Microscopy (SIM)
P33 · Poster · 111. Conference (2010)
PDF
New Holistic Self-Calibration Method for Deflectometric Sensors
A10 · Talk · 110. Conference (2009)
PDF
Can deflectometry work in presence of parasitic reflections?
A12 · Talk · 110. Conference (2009)
PDF
3D-microscopy with large depth of field
P23 · Poster · 110. Conference (2009)
PDF
Object tilt - a source of systematic error in transmission deflectometry
P24 · Poster · 110. Conference (2009)
PDF